High Speed
Full range current rising time: 10uS
- Making the system impact resistance stronger and reliabiltity higher.
- Making the the power supply ripple rejection ratio higher and loading more accurate.
- For the equipments with same rated current, the higher the current rising slew rate is, the higher the transient test confidence degree is.
- Making CV mode loading more stable and supporting small output capacitance CC source application (eg.chargers and LED power supply).
High-peed Synchronized Sampling
500Khz synchronous sampling
- Software protection response time is shorter and system is more reliable.
- Measuring bandwidth is higher. When testing the high ripple power supply or making the dynamic loading, the confidence degree of measurement is higher.
- Synchronous sampling, loading accuracy is higher.
- Supporting transient analysis and providing more intelligent application.
Automatic Test Alone
- Supporting 8 working modes and 14 measured items intelligent loading and qualification evaluation.
- Supporing 8 list files, each file with up to 50 steps automatic test.
- Supporting hardware trigger input and output.
- Supporting single step manual test.
- Supporting complete test report.
High-luminance & Full View Graphic Dot Matrix Screen
- High luminance and complete view display, fit for production line.
- Big screen with graphic dot matrix.
- Adjustable illuminate, fit for different working environment.
- Personalized display, fit for different application.
Filtering Speed Programming--Applicable to Power Supply with High Ripple
- 15Hz、4Hz、1Hz three filtering speed.
- 15Hz high filtering speed, ensuring fast measurement and improving production efficiency.
- 1Hz low filtering speed, ensuring the most accurate measurement in harsh environment.
CC Source Application in CP/CR Mode
- CP algorithm is optional. Supporting CV source and CC source test, fit for LED power supply and chargers.
Automatically Detecting & Matching CC/CV Source in CR Mode
- Specific algorithm, automatically detecting the type of the measured source and automatically matching CR algorithm.
- Special hardware topological structure, ensuring CR algorithm seamless transition.
